Frontier Semiconductor (FSM) manufactures advanced metrology products and solutions specifically for semiconductor, LED, solar, flat panel display (FPD), data storage, and MEMS applications. Their capabilities include stress measurement, film adhesion testing, wafer topography metrology, and electrical characterization. Notable products include the FSM 128 Series systems, which are room temperature, full-wafer 2D/3D stress mapping systems utilizing patented non-contact Opti-Lever dual-laser technology. They also provide systems for contact and non-contact sheet resistance measurement, stress hysteresis measurement, and thickness mapping, with options for high precision and automation in various processes.
Rapid Probe Microscope, Metron3D
Macro Inspection Device Stealth, Thin Film Stress Measurement Device FLX, Film Thickness Measurement Device TohoSpec3100, Hall Effect Mea...
Load Board, Probe Card, IC Burn-in Board, FPGA Evaluation Board
Leak Testing (Air/Water), Flow Testing, Electrical Continuity Tests, Vision Inspection Systems, End-of-Line (EOL) Testers, Thermal Stress...
ORP Sensor Cartridge for WQ-300 series, Panel mount type water quality measuring instruments, Explosion-proof Gas Analyzer, Gel-filled Se...
Bottle-Top Burette, Bottle-Top Dispenser, Electronic Pipettes, Micropipettes, Pipette Aids, Pipette Tips, Series Pipettor, Autoclave, Bal...