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About
Unisers AG specializes in contamination analysis technology for the semiconductor industry. They utilize a proprietary three-step process involving a metal film coating to create optical antennas for particle detection, followed by optical analysis to amplify signals for imaging and spectroscopy. Their technology enables particle sizing down to 10 nm using Surface Enhanced Particle Sizing (SEPS) and molecular characterization through Surface Enhanced Raman Spectroscopy (SERS). This allows for the identification and classification of contaminants on various surfaces, particularly silicon wafers, improving chip manufacturing yield and reducing waste.
Products & Services
automated in-line 300mm wafer review systemSurface Enhanced Particle Sizing (SEPS)Surface Enhanced Raman Spectroscopy (SERS)
Certifications
ISO 9001ISO 14001ISO/IEC 27001
Quick Facts
- Location
- 8048 Zürich, Switzerland, Switzerland
- Category
- Test & Measurement
