TeraProbes specializes in fully automated non-contact on-wafer probing systems. The company was founded in 2014 as a result of our research at The Ohio State University's Department of Electrical and Computer Engineering. We believe that our non-contact probing technology can help alleviate the pains associated with contact probe wear and tear, contact repeatability, and the extremely high hardware and operation costs associated with the on-wafer device and IC characterization in the high-speed electronics industry.
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