Back to Directory
About
株式会社YGK specializes in wafer surface inspection equipment, providing advanced solutions for the semiconductor industry. Their product line includes various models of particle scanners designed for different types of wafers, including silicon, GaAs, and InP. The company offers both manual and automatic transport systems, with specifications that accommodate wafer sizes from 2 to 8 inches. Their equipment is capable of detecting defects and particles on glass substrates and opaque wafers, making them suitable for high-precision applications in semiconductor manufacturing.
Products & Services
Glass Substrate Inspection Equipment XGSWafer Surface Particle Scanner YPI-MXWafer Surface Particle Scanner YPI-MX (Semi-Auto)Wafer Surface Particle Scanner YPI-MX FOUPWafer Surface Particle Scanner YPI-MN (Semi-Auto)Wafer Surface Particle Scanner YPI-MX TFWafer Surface Particle Scanner YPI-MX TF FOUPWafer Surface Particle Scanner YPI-MX-DCWafer Surface Particle Scanner YPI-MX-DC (Semi-Auto)Wafer Surface Particle Scanner YPI-MX-DC SMIFPellicle Particle Scanner YPI-MX P
Quick Facts
- Location
- Minami-Alps, Yamanashi, Japan, Japan
- Category
- Test & Measurement
