Teldevice specializes in wafer pattern defect inspection systems, providing advanced solutions for the semiconductor industry. Their product offerings include various defect inspection systems tailored for silicon carbide (SiC) and silicon wafers, as well as glass wafers. The company focuses on high-precision inspection technologies to ensure quality control in electronic product development and manufacturing processes.
Vision sensors, smart cameras
Go-X, Go, Spark, Apex, Fusion, Sweep+, monochrome cameras, trilinear cameras, prism-based cameras, 3-CMOS prism-based R-G-B area scan cam...
CMOS image sensors, ASICs
telecentric lens, optical zoom lens, FA Lens, 360° lenses
Coaxlink QSFP28, EasyDeepOCR, EasySpotDetector, eGrabber, EasyClassify, Coaxlink QSFP+, GigE Vision Device IP Core, Coaxlink Quad CXP-12,...
lighting, optics, cameras, vision sensors, capture plates, processing systems, intelligent vision systems, artificial vision software, ac...